The International Conference on Semiconductor Nanostructures for Optoelectronics and Biosensors- SeNOB 2016 will be held in Rzeszow, Poland May 22-25, 2016. The event is organized by the Center for Microelectronics and Nanotechnology at the Faculty of Mathematics and Natural Sciences of the University of Rzeszow under the auspices of the Committee on Materials Science of the Polish Academy of Sciences.
The Conference is aimed to:
- give an overview of the current status of layer-structured materials (including topological insulators) as well as one-dimensional nanomaterials, with a particular emphasis on state-of-the-art metrology for defects and impurities detecting using modern methods TEM, SIMS, Nano-Raman etc.;
- provide a wide discussion on the MBE technology, nanopatterning and nanolithography, photolithography and electron lithography for the production of integrated circuits and elements of quantum wells applied in the clean room equipment and instruments used to carry out magneto-transport measurements at low temperatures and explore optical properties of nanostructures;
- promote and encourage the interaction between academic and industrial research communities (instrument manufacture, IC and optoelectronics industry and materials suppliers) to address scientific and technological challenges associated with the improvement of standard analytical methods and qualification of newer techniques.
Manufacturing processes are becoming more and more complicated that requires new technologies and new metrology; this is particularly true in the microelectronics and micro-systems industry, such as compound semiconductor nano-electronics, phononics, MEMS and sensors.